LT-TS3-42 Three-box cold and thermal shock test chamber

Short Description:

This three-box thermal shock test chamber features independent high-temperature, low-temperature, and test zones for static thermal shock testing. It evaluates material tolerance under rapid temperature changes, quickly revealing physical damage or performance degradation caused by thermal expansion and contraction.

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Product Detail

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Product parameters
1	Temperature range	(150 ℃ – F: – 45 ℃; S: ℃); High temperature zone in high temperature zone:+60 ℃~+150 ℃; Lowtemperature zone in low temperature zone: – 10 ℃~- 65 ℃; ）
2	Heating time (heat storage area)	about 35min for RT~200 ℃
3	Cooling time (cold storage area)	about 85min for RT~- 70 ℃
4	Temperature recovery time/switching time	≤ 5min/≤ 5sec
5	Temperature control accuracy/distribution accuracy	± 0.5 ℃/± 2.5 ℃
6	Internal and external materials	the external box SUS304 # is made of stainless steel, and the internal box SUS304 # is made of stainless steel
7	Insulation material	High-temperature resistant high-density aluminum silicate brazed cotton or PU foam insulator material
8	System	P.I.D+S.S.R+Microcomputer balanced temperature regulation control system
9	Cooling system	semi-hermetic double-stage compressor (water cooled)/fully hermetic double-stage compressor (air cooled)
10	Safety protection device	no fuse switch, compressor high and low pressure protection switch, refrigerant high pressure protection switch, fault warning system, electronic alarm
11	Fittings	viewing window (special option), two upper and lower adjustable layers, power-on measuring line hole, castor, horizontal support
12	Power supply	AC380V 50HZ/60HZ 3 Φ
13	Controller	Korean “TEMI” South Korea “TEMI” or Japanese “OYO” Brand Optional
14	Compressor	France/s “Tecumseh” Brand

Standard
1	GJB 150.5A-2009 temperature impact test
2	GB/T 2424.13-2002 Temperature impact test
3	GJB 360B-2009 temperature impact test
4	GB/T 2423.2-2008 High Temperature Test Method
5	GB/T 2423.1-2008/IEC 6008-21-2007 Low-temperature test method
6	GB/T 10589-2008 Technical Conditions for Low-temperature Test Chamber
7	GB/T 11158-2008 Technical Specification for High-temperature Test Chamber