LT-HAST-250 HAST high pressure accelerated aging test chamber

Short Description:

The HAST (Highly Accelerated Stress Test) chamber utilizes an unsaturated high-pressure steam environment to conduct rigorous accelerated aging and hermeticity tests on electronic components, semiconductor packaging, and PCBs. It aims to rapidly uncover latent defects, significantly shortening product development and quality verification cycles.

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Product structure
1	The test chamber is composed of an insulation box (pressure bearing structure) at the front, a refrigeration and vacuum unit at the rear and an electrical controller (system) on the gate of the test chamber.
2	The electrical control panel is placed on the front door of the test box for easy operation.
3	Refrigeration unit and vacuum unit shall be placed in independent crate to reduce the impact of vibration and noise during operation of refrigeration unit on test box and facilitate the installation and maintenance of equipment.
4	In order to reduce the noise generated during the operation of the refrigeration vacuum unit, special sponge sound-absorbing materials for sound absorption and sound insulation are installed on the inner wall of the crate. Anti-vibration and noise reduction measures are taken for the main moving parts.

Standards
1	GB/T10586-1989 Technical Conditions for Damp Heat Laboratory.
2	GB2423.3-93 (IEC68-2-3) Constant humidity and heat test.
3	MIL-STD810D Method 502.2.
4	GJB150.9-8 temperature and humidity test.
5	GB2423.34-86, MIL-STD883C Method 1004.2 Combined Cycling Test of Temperature and Humidity and High Pressure.